Simulation of X-ray diffraction curves from ion-implanted wafers and relaxed II-VI superlattices
- 14 April 1993
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 26 (4A) , A177-A180
- https://doi.org/10.1088/0022-3727/26/4a/037
Abstract
No abstract availableKeywords
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