Multiple-Beam X-ray Diffraction for Physical Determination of Reflection Phases and its Applications
- 1 March 1997
- journal article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
- Vol. 53 (2) , 108-143
- https://doi.org/10.1107/s0108767396011117
Abstract
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