Intrinsic Josephson effects in submicrometre Bi2212 mesas fabricated by using focused ion beam etching

Abstract
We have investigated the current-voltage (I-V) characteristics of sub-µm sized mesas made on the surface of Bi2Sr2CaCu2O8 (Bi2212) single crystals. The mesas were fabricated using focused ion beam etching. The samples showed excellent I-V characteristics and their conductance-voltage (G-V) curves were measured from above the transition temperature down to 4.2 K. New ways of making annular mesas with diameters down to 0.5 µm were also investigated.