Conducting atomic force microscopy of alkane layers on graphite

• 8 May 1995
• journal article
• Published by AIP Publishing in Applied Physics Letters
• Vol. 66  (19) , 2478-2480
• https://doi.org/10.1063/1.114001

Abstract

Keywords

• THIN FILM
• ATOMIC FORCE MICROSCOPY
• PARTICLE DETECTOR
• ATOMIC FORCE MICROSCOPE