Sensing Molecular Density of Monolayers from Fluoroalkyltrichlorosilane Using Atomic Force Microscope Having a Tip Modified with Fluoroalkyltrichlorosilane Molecules

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Abstract
Force curves were measured on monolayers from fluoroalkyltrichlorosilane on silicon substrates using the atomic force microscope (AFM) having a tip which was chemically modified with fluoroalkyltrichlorosilane molecules. Adhesive force arose between the monolayers and the chemically modified AFM tip, and it increased with an increase in the amount of coverage of the monolayers. In contrast, the adhesive force exerted on the unmodified AFM tip was independent of the amount of coverage of the monolayers. These results indicate the AFM with a chemically modified tip can detect the molecular density of the monolayers.