Large aperture point-focusing diffractor for x rays
- 25 April 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 52 (17) , 1381-1382
- https://doi.org/10.1063/1.99122
Abstract
A doubly bent germanium single crystal with toroidally curved crystal planes was used to obtain three‐dimensional focusing of monochromatic x rays from a microfocus source. The Johansson geometry in radial planes was obtained by cutting a cylindrically curved lamella, polishing, etching, and bending over a spherical mold of ∼50 mm radius at 740 °C. The bent crystal was aligned to obtain the Cu Kα (333) reflection in the spot which had a principal focus of ∼100 μm. Allowing for anode pitting and extraneous reflections, the observed x‐ray intensity was ∼10 times lower than expected theoretically. The discrepancy was attributed to imperfect bending and crystal defects.Keywords
This publication has 1 reference indexed in Scilit:
- Principles and Practice of X-Ray Spectrometric AnalysisPublished by Springer Nature ,1975