SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range
- 15 September 2003
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 433-436, 941-944
- https://doi.org/10.4028/www.scientific.net/msf.433-436.941
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- X-ray astronomy: energies from 0.1 keV to 100 keVPublished by Springer Nature ,2013
- High resolution x-ray spectroscopy using GaAs arraysJournal of Applied Physics, 2001
- Epitaxial silicon carbide for X-ray detectionIEEE Transactions on Nuclear Science, 2001
- In-situ, non-destructive identification of chemical elements by means of portable EDXRF spectrometerIEEE Transactions on Nuclear Science, 1999
- Epitaxial silicon carbide charge particle detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1999
- Simultaneous measurement of neutron and gamma-ray radiation levels from a TRIGA reactor core using silicon carbide semiconductor detectorsIEEE Transactions on Nuclear Science, 1999
- PrefacePublished by Elsevier ,1995
- Energy analysis of neutral H, D, He and Ne atoms with energies from 200 eV to 10 keVVacuum, 1978