Characterization of dislocations by double crystal X-ray topography in back reflection
- 16 February 1991
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 123 (2) , 379-392
- https://doi.org/10.1002/pssa.2211230204
Abstract
No abstract availableKeywords
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