Pulse-shape analysis of ionization events in low-temperature germanium detectors

1 January 2002

proceedings article
Published by AIP Publishing in AIP Conference Proceedings

https://doi.org/10.1063/1.1457700

Abstract

Pulse-shape analysis, supported by numerical simulations, provides a powerful tool to investigate ionization phenomena in low-temperature semiconducting detectors for the Edelweiss dark-matter experiment. We present a first application of these methods to characterize the surface, as compared with bulk ionization events. Future prospects include an investigation of space-charge effects on charge collection efficiency, with an aim towards improving the operating conditions of the detectors.

Keywords

GERMANIUM RADIATION DETECTORS
ASTRONOMICAL INSTRUMENTS
PULSE ANALYSERS
PULSE SHAPING
IONISATION
SPACE CHARGE
SURFACE PHENOMENA
DARK MATTER
HYPOTHETICAL PARTICLES
LOW-TEMPERATURE TECHNIQUES

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