Fabrication of submicron BSCCO stacked junctions by focused ion beam (FIB)
- 1 June 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Applied Superconductivity
- Vol. 9 (2) , 4312-4315
- https://doi.org/10.1109/77.783979
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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