Sputtered silicate-limit NASICON thin films for electrochemical sensors☆

• 1 January 1994
• journal article
• Published by Elsevier in Solid State Ionics
• Vol. 67  (3-4) , 295-299
• https://doi.org/10.1016/0167-2738(94)90020-5

Abstract

Keywords

• FUNCTION
• ELECTROCHEMICAL SENSORS
• MEASURED CONDUCTIVITY
• LIMIT NASICON
• SILICATE LIMIT
• NASICON THIN
• SPUTTERED SILICATE
• PROPERTIES SPUTTERED