Arc‐Imaging Technique for Measuring High‐Temperature Thermal Conductivity and Diffusivity of Refractory Oxides

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Abstract
An imaging technique was developed for measuring the thermal conductivity and diffusivity of small disks of refractory oxides at temperatures ranging from 1500°K to the melting point of the material. One face of the sample is exposed to the radiant heat flux of an arc‐imaging furnace. A shutter instantaneously cuts off incident radiation, and the cooling of the specimen is recorded with a motion‐picture camera. The flux re‐radiated by the nonirradiated face of the sample is measured with a thermopile. Thermal conductivity and temperatures in the bulk of the sample are determined by computational analysis. Experimental data are fitted to computed cooling‐temperature curves to determine thermal diffusivity. This technique was applied to pure and stabilized ZrO2, Y2O3, and ThO2.