High precision measurement of the SOS surface thickness in the rough phase

1 December 1991

journal article
Published by EDP Sciences in Journal de Physique I

Vol. 1 (12) , 1669-1673
https://doi.org/10.1051/jp1:1991234

Abstract

Using a cluster algorithm without critical slowing down for the discrete Gaussian SOS model, we verify to high precision the linear dependence of the surface thickness on the logarithm of the lattice size

Keywords

HIGH PRECISION MEASUREMENT
ROUGH PHASE
SOS SURFACE
SURFACE THICKNESS

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