Synchrotron x-Ray Topographic Study Of Dislocations In Gaas Detector Crystals Grown By Vertical Gradient Freeze Technique
- 1 January 1997
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Synchrotron topographic study of defects in liquid-encapsulated Czochralski-grown semi-insulating gallium arsenide wafersJournal of Crystal Growth, 1993
- Characterization of dislocations by double crystal X-ray topography in back reflectionPhysica Status Solidi (a), 1991
- Use of synchrotron radiation in X-ray diffraction topographyPhysica Status Solidi (a), 1974