High-accuracy analog Hall probe
- 1 April 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 46 (2) , 613-616
- https://doi.org/10.1109/19.571937
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Nonlinearity in hall devices and its compensationSolid-State Electronics, 1988