Abstract
Structure and fabrication of single-gate GaAs p-n junction field-effect transistors is described. The devices employ n-type GaAs layers grown epitaxially on semi-insulating substrates of GaAs. Experimental devices indicate a cutoff frequency of approximately 2 GHz. Optimized device geometries promise operation at microwave frequencies as amplifiers and oscillators. Negative resistance oscillations above a field of approximately 3 × 103V/cm have been observed.

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