Computer-controlled simultaneous measurements of the thermopower and conductivity of thin films

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Abstract
A microcomputer-controlled apparatus for the simultaneous measurement of the conductivity and the Seebeck coefficient of thin solid films is described. The investigated temperature range lies from room temperature to 1100 degrees C. The apparatus was tested on thin films of oxides produced in argon gas by RF sputtering. It is shown that the noise in the measured quantities is small enough to allow a further discrimination between the various models of electron transport. The overall noise in the thermopower is 1.5%, whereas it is 3*10-3 for the conductivity. It is found that noise is essentially an electronic noise and so could be improved.

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