On the Structure of Planar Defects in ALN
- 1 January 1989
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Planar defects in AINProceedings, annual meeting, Electron Microscopy Society of America, 1989
- High‐resolution electron microscopy of ceramic interfacesJournal of Electron Microscopy Technique, 1989
- A simple method for the determination of structure-factor phase relationships and crystal polarity using electron diffractionJournal of Applied Crystallography, 1982