Some applications to materials analysis using deuteron and proton beams of 0.5 to 2.5 MeV
- 1 March 1979
- journal article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 48 (1) , 253-275
- https://doi.org/10.1007/bf02519791
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- The structure and stoichiometry of anodic films on V, Nb, Ta, Mo and WJournal of Materials Science, 1977
- Influence of stoichiometry on the metal-semiconductor transition in vanadium dioxideJournal of Applied Physics, 1974
- Applications of Ion Beams to MetalsPublished by Springer Nature ,1974
- An electron microscopic investigation of the decomposition of V2O5Journal of Physics and Chemistry of Solids, 1970
- The structure of erbium deuteride targets for neutron generatorsNuclear Instruments and Methods, 1968
- ION IMPLANTATION OF SILICON: I. ATOM LOCATION AND LATTICE DISORDER BY MEANS OF 1.0-MeV HELIUM ION SCATTERINGCanadian Journal of Physics, 1967
- The location of oxygen atoms in vanadium-oxygen alloys by means of neutron diffractionActa Metallurgica, 1953
- Angular Distribution of the Reactionbetween 240 kev and 3.56 MevPhysical Review B, 1953
- Cross Section and Angular Distribution of theReactionPhysical Review B, 1952
- The Angular Distributions of the Products of the D - D Reaction: 1 to 3.5 MevPhysical Review B, 1948