Electromigration in the presence of a temperature gradient: Experimental study and modelling
- 1 September 1988
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 17 (5) , 473-478
- https://doi.org/10.1007/bf02652135
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A model for electromigration behaviour in terms of flux divergencesScripta Metallurgica, 1987
- Activation energies for the different electromigration mechanisms in aluminumSolid-State Electronics, 1981
- Stress generation by electromigrationApplied Physics Letters, 1976
- Electromigration in thin aluminum films on titanium nitrideJournal of Applied Physics, 1976
- Electromigration in thin gold films on molybdenum surfacesThin Solid Films, 1975