Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation: Analysis Using Positron Lifetime Measurement
- 1 November 1994
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 175-178, 423-426
- https://doi.org/10.4028/www.scientific.net/msf.175-178.423
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