The photoemission spectromicroscope multiple‐application x‐ray imaging undulator microscope (maximum)
- 1 May 1990
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 8 (3) , 2563-2565
- https://doi.org/10.1116/1.576736
Abstract
We discuss the implementation of phase I of the spectromicroscopy program maximum (multiple‐application x‐ray imaging undulator microscope) at the Wisconsin Synchrotron Radiation Center. Successful feasibility tests included taking photoemission micrographs with lateral resolution of a few microns, line scans, knife‐edge tests, photon flux measurements, and characterization of the focusing performance.Keywords
This publication has 0 references indexed in Scilit: