U-Junction Ge(Li) Drift Detectors
- 1 January 1967
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 14 (1) , 503-508
- https://doi.org/10.1109/TNS.1967.4324461
Abstract
A U-junction drifting configuration has been used which permits the fabrication of large volume, low-capacitance detectors in much less time than previously required. For example, it is now possible, with good material, to fabricate in approximately one week an 18-cm3 diode with 3-pF capacitance. The U-junction structure is partially wrapped around three sides of a parallelepiped of the desired dimensions. The drifting then proceeds toward the remaining side of the detector. At the completion of the drift, only a narrow strip of P-type material remains along one edge. The portion of the lithium junction used for the rapid drift is now lapped off, leaving the low-capacitance junction structure for the collection of the charge. No further processing is required, and the diode is ready for mounting. Initial tests on two 6-cm3 U-junction detectors indicate that the diodes have the expected capacitance of about 2 pF and a relatively thin window. A resolution of 705 eV for the 60-keV gamma ray of Am241 has thus far been obtained, and the measured Fano factor of 0.157 is consistent with the currently accepted value.Keywords
This publication has 3 references indexed in Scilit:
- Characteristics of Some Large, Coaxial Lithium-Drift Semiconductor Gamma-Ray SpectrometersIEEE Transactions on Nuclear Science, 1966
- A Fabrication Technique for Significantly Reducing the Capacitance of Large-Volume Ge LID DetectorsIEEE Transactions on Nuclear Science, 1966
- Large-Volume Coaxial Germanium Gamma-Ray SpectrometersIEEE Transactions on Nuclear Science, 1966