CCD memory arrays with fast access by on-chip decoding

• 1 January 1974
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• Vol. XVII, 210-211
• https://doi.org/10.1109/isscc.1974.1155236

Abstract

Keywords

• CHARGE COUPLED DEVICES
• DECODING
• CLOCKS
• CIRCUIT TESTING
• SILICON
• ELECTRODES
• SEMICONDUCTOR DEVICE MEASUREMENT
• INTEGRATED CIRCUIT INTERCONNECTIONS
• BONDING
• DESIGN OPTIMIZATION