Weak beam observation of dislocation loops in silicon

This publication has 3 references indexed in Scilit:

• Correlation of electron microscope studies with the electrical properties of boron implanted silicon
  Radiation Effects, 1970
• Investigations of dislocation strain fields using weak beams
  Philosophical Magazine, 1969
• The distribution of condensed defect structures formed in annealed boron-implanted silicon
  Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1969