Measuring high-bandwidth signals in CMOS circuits

30 September 1993

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 29 (20) , 1761-1762
https://doi.org/10.1049/el:19931173

Abstract

In this Letter we present a technique to measure details of the shape of high-bandwidth signals in CMOS circuits. This technique allows us to study quantities in the subnanosecond range as, for instance, the rise time of a clock edge or the detailed shape of noise pulses.

Keywords

SUBNANOSECOND RANGE
CMOS CIRCUITS
CLOCK EDGE
HIGH-BANDWIDTH SIGNALS
RISE TIME
NOISE PULSES

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