The use of the electron microprobe analyser for the study of the composition of the terminations of conducting filaments in MIM structures
- 1 June 1976
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 21 (1) , 147-150
- https://doi.org/10.1016/0022-3093(76)90101-0
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Electron emission and related properties of amorphous thin films of mixed barium and silicon oxidesThin Solid Films, 1974
- Kinetics of growth of conductive filament in AsTeGe glassesJournal of Non-Crystalline Solids, 1973
- Electric field-induced filament formation in AsTeGe glassJournal of Non-Crystalline Solids, 1970