Photoelectron diffraction from layeredSb2Te2Se

Experimental photoelectron data consisting of azimuthal plots of emissions from high-lying core levels at fixed polar angle from the layered compound ${\mathrm{Sb}}_2$ ${\mathrm{Te}}_2$Se have been collected over a wide range of final energies (15-75 eV). The unique structure of ${\mathrm{Sb}}_2$ ${\mathrm{Te}}_2$Se was employed to obtain three sets of core-level emissions from the three atomic species. This in turn gives an excellent opportunity to compare a multiple-scattering theory with the three single-site emissions, two of which lie beneath the surface atomic layer. The results of the comparison are used to determine the surface structure of the layered compound. The emissions from the Sb core level provide valuable information to the relative contributions of electrons emitted from different depths of the sample.