Determination of optical constants of thin film coating materials based on inverse synthesis
- 15 October 1983
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 22 (20) , 3191-3200
- https://doi.org/10.1364/ao.22.003191
Abstract
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This publication has 27 references indexed in Scilit:
- Photoacoustic measurement of low-level absorptions in solidsApplied Optics, 1981
- Optical constants of Inconel alloy filmsJournal of the Optical Society of America, 1973
- An analysis of the errors in optical constants obtained from reflectance measurementsJournal of Physics D: Applied Physics, 1971
- The optimum angle of incidence for determining optical constants from reflectance measurementsJournal of Physics D: Applied Physics, 1970
- The accuracy of some photometric methods for the determination of n, k and d for thin filmsJournal of Physics D: Applied Physics, 1970
- Determination of Optical Constants from Reflectance or Transmittance Measurements on Bulk Crystals or Thin FilmsJournal of the Optical Society of America, 1968
- Theoretical studies of the sensitivities of non-normal incidence methods for measuring the optical constants of thin filmsBritish Journal of Applied Physics, 1967
- A theoretical study of the sensitivities of some normal incidence methods for measuring the optical constants and thicknesses of thin filmsBritish Journal of Applied Physics, 1967
- Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film ThicknessApplied Optics, 1966
- Absolute Infrared Intensity Measurements in Thin Films. II. Solids Deposited on Halide PlatesThe Journal of Chemical Physics, 1963