New antiferromagnetic insulator superlattices: Structural and magnetic characterization of ((
- 3 December 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 65 (23) , 2913-2915
- https://doi.org/10.1103/physrevlett.65.2913
Abstract
High-quality antiferromagnetic (AF) superlattices ( ( , as judged from high-resolution x-ray diffraction (HRXD), were grown on (001) substrates. Using HRXD, the thermal-expansion coefficient (T) vs T was measured. While two shifted AF anomalies are seen for (m,n)=(25,30), only one is observed for (m,n)=(19,6). Comparison of (T) in the two superlattices with that of and indicates that a significant redistribution of the magnetic entropy occurs.
Keywords
This publication has 13 references indexed in Scilit:
- Antiferromagnetic standing-spin-wave resonance in epitaxial films of MnF2Journal of Applied Physics, 1990
- Equation-of-state analysis of the effects of an induced staggered field on the phase transition ofPhysical Review B, 1989
- Theory of antiferromagnetic superlattices at finite temperaturesPhysical Review B, 1989
- Critical behavior of epitaxial antiferromagnetic insulators: Interdigital capacitance measurement of magnetic specific heat ofthin filmsPhysical Review B, 1989
- Growth of alkali halides from molecular beams: Global growth characteristicsPhysical Review Letters, 1989
- New approaches to epitaxy of transition metals and rare earths: Heteroepitaxy on lattice-matched buffer films on semiconductors (invited)Journal of Applied Physics, 1988
- Neutron diffraction study of artificial CoO-NiO superlatticesApplied Physics Letters, 1987
- Observation of antiferromagnetic resonance in epitaxial films ofPhysical Review B, 1986
- Molecular beam epitaxy growth and applications of epitaxial fluoride filmsJournal of Vacuum Science & Technology A, 1986
- New Class of Layered MaterialsPhysical Review Letters, 1980