Point-contact current-imaging atomic force microscopy: Measurement of contact resistance between single-walled carbon nanotubes in a bundle
- 24 March 2003
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 82 (12) , 1944-1946
- https://doi.org/10.1063/1.1563308
Abstract
Conductance of bundled single-walled carbon nanotubes (b-SWCNTs) are measured by point-contact current-imaging atomic force microscopy (PCI–AFM). Simultaneous mapping of the topographic information and current through SWCNTs enable us to investigate the relationship between structure and conductance. Variation in resistance of a b-SWCNT indicates that the resistance between SWCNTs was higher than with strong voltage dependence. Because PCI–AFM measurement can obtain vertical conductance information, this approach appears to be a powerful technique for characterization of nanoscale electronic devices.
Keywords
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