Self-Testing Computers
- 1 October 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
- Vol. 12 (10) , 49-59
- https://doi.org/10.1109/MC.1979.1658498
Abstract
Built-in-test techniques exploit hardware redundancy to provide continuous on-line monitoring of computer performance. Hardware's declining cost makes these techniques attractive, especially for modular computers.Keywords
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