A Bayesian Note on Reliability Growth During a Development Testing Program
- 1 December 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-26 (5) , 346-347
- https://doi.org/10.1109/tr.1977.5220195
Abstract
The problem of estimating the reliability of a system which is undergoing development testing is considered from a Bayesian standpoint. Formally, m sets of binomial trials are performed under conditions which lead to an ordering, θ1 < θ2</sub. < ... < θm, of the binomial parameters. The parameter of interest is θm, the final underlying reliability of the system. The marginal posterior pdf for θm is easily obtained when uniform prior pdf's are assumed. The method is illustrated.Keywords
This publication has 3 references indexed in Scilit:
- A Bayesian Reliability Growth Model for Computer SoftwareJournal of the Royal Statistical Society Series C: Applied Statistics, 1973
- A Bayesian Reliability Growth ModelIEEE Transactions on Reliability, 1968
- Reliability Growth during a Development Testing ProgramTechnometrics, 1966