Preparation of Electron Probe Microanalyzer Standards using a Rapid Quench Method
- 1 January 1966
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 10, 431-446
- https://doi.org/10.1154/s0376030800004596
Abstract
Standards for microprobe analysis can be made to serve two purposes: (a) proposed correction models can be tested with them, and (b) analysis can be performed more accurately in the system which includes the standard. Few microprobe standards presently are available because they must be homogeneous on the micron scale and their composition must be known accurately. A modified Duwez splat cooling method is described which enables the investigator to prepare suitable standards in most cases. The apparatus which is relatively simple and inexpensive is described in detail. The systems Au-Si and Al-Mg were chosen as test cases. Suitable standards were prepared at different concentrations in each system. The analytical results for all compositions in Al-Mg are presented and discussed.Keywords
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