Probe beam deflection investigation of the charge storage reaction in anodic iridium and tungsten oxide films
- 1 December 1990
- journal article
- Published by Elsevier in Journal of Electroanalytical Chemistry and Interfacial Electrochemistry
- Vol. 296 (1) , 37-49
- https://doi.org/10.1016/0022-0728(90)87231-8
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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