Magnetic resonance of thin-film single-crystal epitaxial dilute alloys

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Abstract
The magnetic resonance of thin (<1 μm) Ag: Er films, epitaxially grown on cleaved NaCl (001) faces, is reported. An anisotropy associated with the thermal strain is observed. The magnitude of the anisotropy allows for the extraction of the orbit-lattice coupling constant. The angular variation of the linewidth is ascribed to a spatial dependence of the internal strain. It is shown that systematic linewidth studies as a function of film thickness will allow for the extraction of the internal strain distribution for an epitaxially grown film.