Plasma silicon oxide films on garnet substrates: measurement of their thickness and refractive index by the prism coupling technique
- 15 September 1981
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 20 (18) , 3184-3188
- https://doi.org/10.1364/ao.20.003184
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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