The measurement of the X-ray scattering factors of silicon from the fine structure of Laue-case rocking curves
- 1 October 1980
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 13 (5) , 410-416
- https://doi.org/10.1107/s0021889880012460
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