Secondary-ion yields of rare earths
- 1 October 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 54 (1-2) , 31-40
- https://doi.org/10.1016/0168-1176(83)85003-4
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- New rare earth element standards for electron microprobe analysisPublished by Elsevier ,2003
- Depth profiling by ion microprobe with high mass resolutionInternational Journal of Mass Spectrometry and Ion Physics, 1979
- Molecular versus atomic secondary ion emission from solidsThe Journal of Chemical Physics, 1978
- Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standardsAnalytical Chemistry, 1977
- The thermodynamics of ionization of gaseous oxides; the first ionization potentials of the lanthanide metals and monoxidesThe Journal of Chemical Physics, 1976
- A combined ion probe/spark source analysis systemVacuum, 1974
- Secondary ion mass spectrometry of rare earth elementsAnalytical Chemistry, 1974
- Ground Levels and Ionization Potentials for Lanthanide and Actinide Atoms and IonsJournal of Physical and Chemical Reference Data, 1974
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973