Comparison of TEM and APFIM in microstructural characterization and interpretation: An overview

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Abstract
A comparison of transmission electron microscopy (TEM) and atom probe field‐ion microscopy (APFIM) is presented with respect to the interpretation of complex microstructures, phase identification, determination of crystallographic order, and analysis of interfaces. The capabilities, spatial resolutions, and limitations of each technique are discussed with examples taken from combined analytical electron microscopy (AEM) and APFIM studies. Both techniques are extremely powerful for routine characterization of a wide range of materials, although care must be exercised in experimentation and interpretation. The combined use of TEM and APFIM is synergistic and extends their individual capabilities from the macro scale to the atomic level.