Ballistic electron emission microscopy study of PtSi–n-Si(100) Schottky diodes
- 1 March 1992
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 10 (2) , 580-585
- https://doi.org/10.1116/1.586416
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: