Secondary ion emission from dielectric films as a function of primary ion velocity
- 1 July 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 198 (1) , 69-74
- https://doi.org/10.1016/0167-5087(82)90054-0
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Fast Heavy-Ion Induced Desorption of BiomoleculesIEEE Transactions on Nuclear Science, 1981
- Secondary ion mass spectrometry of nucleic acid components: Pyrimidines, purines, nucleosides and nucleotidesJournal of Mass Spectrometry, 1980
- Desorption of organic compounds from solid surfaces by bombardment with heavy ions from a tandem acceleratorSurface Science, 1980
- The stopping of energetic ions in solidsNuclear Instruments and Methods, 1980
- Fast ion induced desorption and collective electronic perturbation at the surfaceSurface Science, 1979
- Measurements of pulse-height defect in AuSi detectors for H, He, C, N, O, Ne, Ar, Kr from ≈2 to ≈ 400 keV/nucleonNuclear Instruments and Methods, 1978
- A Method for the Study of Correlated Events in Time-of-Flight Mass-Spectrometry and its Application to Fission-Fragment Induced DesorptionZeitschrift für Naturforschung A, 1978
- Experimental Investigation about the Mechanism of Fission-Fragment Induced DesorptionZeitschrift für Naturforschung A, 1977
- New approach to the mass spectroscopy of non-volatile compoundsBiochemical and Biophysical Research Communications, 1974
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969