Radiation Hardened LSI for the 1980's: CMOS/SOS vs. I2L
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (6) , 2336-2340
- https://doi.org/10.1109/tns.1977.4329217
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Microprocessors and integrated electronic technologyProceedings of the IEEE, 1976
- Fundamental limitations in microelectronics—I. MOS technologySolid-State Electronics, 1972