Abstract
The rule of Hashimoto, Howie, and Whelan, much used in electron microscopy for determining the nature of stacking faults, is known to be true when the specimen thickness t is sufficiently great. It is shown that sufficiently great means that the product (t;gg)(gglg~) must be greater than 0�2 for bright field or greater than O� 25 for dark field, these values being for reasonable deviations from the Bragg condition.

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