Direct observation of the flux distribution in the mixed state of V-Ga alloys using a scanning electron microscope
- 11 March 1976
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 9 (4) , 611-613
- https://doi.org/10.1088/0022-3727/9/4/011
Abstract
The mixed state in V-Ga alloys was directly observed using the Bitter pattern technique and a scanning electron microscope. Some parts of the specimen showed a single fluxoid state with an average fluxoid spacing of about 760 AA at 6 kG. The flux patterns were cellular in nature in the high defect density regions of the surface. Surface voids and grain boundaries were the major flux pinning centres in these samples.Keywords
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