Improvement in the reconstruction of surface profile deduced from microdensitometer analysis of electron micrographs of shadowed surface replicas
- 1 January 1984
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 1 (1) , 135-137
- https://doi.org/10.1364/josaa.1.000135
Abstract
The different steps leading to the determination of a surface profile deduced from microdensitometer analysis of electron micrographs of shadowed surface replicas are reviewed. It is shown that monodimensional median filtering is sometimes inadequate to remove the low-frequency noise generated by the Levy-Wiener process. A new treatment is proposed that corrects this disadvantage.Keywords
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