Free-space, broadband measurements of high-temperature, complex dielectric properties at microwave frequencies
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 40 (5) , 842-846
- https://doi.org/10.1109/19.106308
Abstract
A free-space microwave measurement system that is used for the high-temperature measurement of dielectric constants and loss tangents of homogeneous materials and that is applicable to composite materials as well is discussed. The system is capable of operating in the 5.85-40-GHz frequency range and ambient to 850°C temperature range. A computer is used to control and coordinate furnace temperature, network analyzer functions, and data storage. Dielectric constants and loss tangents of the materials are calculated from the measured values of S21. The measurement system, including the high-temperature furnace and the calibration technique, is described. Dielectric constants and loss tangents are presented for fused quartz and boron nitride grade HP in the frequency range 13.0-17.4 GHz and the temperature range from ambient to 850°CKeywords
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