Coated silicas and small-angle X-ray intensity behaviour

• 1 June 1994
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 27  (3) , 249-256
• https://doi.org/10.1107/s0021889893008386

Abstract

Keywords

• SILICAS
• ASYMPTOTIC BEHAVIOUR
• SCATTERED
• FILM THICKNESS
• POROD PLOTS
• RAY INTENSITIES
• SMALL ANGLE
• ANGLE X