Applications of fitting techniques to the Warren-Averbach method for X-ray line broadening analysis
- 1 January 1985
- journal article
- research article
- Published by Walter de Gruyter GmbH in Zeitschrift für Kristallographie
- Vol. 170 (1-4) , 275-287
- https://doi.org/10.1524/zkri.1985.170.1-4.275
Abstract
A method for fitting X-ray line profiles has been devised for application to line broadening analysis. The approximation of the profile by pseudo-Voigt functions (sum of Lorentz and Gauss terms of equal width) has been explored in different cases which frequently occur in the characterization of materials by X-ray diffraction. It has been found that such an approximation is able to give satisfactory fittings of experimental data even in cases with severe overlapping of very broadened peaks. The procedure allows peak separation and application of the Warren-Averbach method for determining crystallite size and strain, in cases that could not be considered meaningful before. The corrected Fourier coefficients are free from “hook” effect and allow determination of physical parameters within the range of information content of experimental data.This publication has 0 references indexed in Scilit: