Two-beam features in electron diffraction patterns – application to refinement of low-order structure factors in GaAs
- 1 November 1988
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
- Vol. 44 (6) , 810-820
- https://doi.org/10.1107/s0108767388004362
Abstract
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